Development of powder diffraction apparatus for small-angle X-ray scattering measurements

A novel type of X-ray collimation system attached to commercial powder diffractometers makes the structural characterization of nanomaterials possible in a wide size range from <0.1 to 100 nm by combination of the small- and wide-angle X-ray scattering techniques. This device can be attached to any existing `θ/θ' powder diffractometer, providing a multi-functional small- and wide-angle X-ray scattering/diffraction apparatus.