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J. Appl. Cryst. (2013). 46, 953-959
https://doi.org/10.1107/S0021889813011333
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Ordered stacking of crystals with adjustable curvatures for hard X- and γ-ray broadband focusing

I. Neri, R. Camattari, V. Bellucci, V. Guidi and P. Bastie
A stack of Si curved crystals has been characterized under hard X-ray diffraction. The stack behaves as if it were a single crystal as a result of diffraction by curved diffracting planes.
Keywords: curved crystals; stacks; X-ray diffraction; X-ray focusing; Laue lenses.
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