Download citation
Download citation

link to html
A new algorithm to extend three-dimensional X-ray diffraction analysis of grain resolved properties to include the characterization of grain resolved stresses is presented. The algorithm has been applied to both simulated and experimental data to validate the obtained results.

Download citation
Download citation

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds