Study of structural defects in ZnGeP₂ crystals by X-ray topography based on the Borrmann effect

The effect of anomalous transmission of X-rays on ZnGeP₂ crystals has been investigated, using the method of X-ray topography based on the Borrmann effect. The identification of the defects revealed in ZnGeP₂ was carried out by comparison of the experimental intensity contrast with simulated images of the defects.