Micropipe-induced birefringence in 6H silicon carbide

The micropipe-induced birefringence of 6H silicon carbide is measured and quantitatively modelled, using the rotating polarizer method.

Quantitative analysis of diffuse X-ray scattering in partially transformed 3C-SiC single crystals

The diffuse X-ray scattering from partially transformed 3C-SiC single crystals is quantitatively analyzed. The transformation mechanisms and the transformation levels are unambiguously determined.