Rotation axis analysis of deformed crystals by X-rays and electrons

The misorientation distributions about given rotation axes in deformed Cu single crystals are shown to be the same for X-ray diffraction (as standard rocking curves) and for high-resolution electron backscattered diffraction (as virtual rocking curves calculated from the orientation data). A new rotation axis imaging scheme is proposed for electron backscattered diffraction maps to highlight specific features of the deformation-induced sub-boundaries.