Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
research papers
Share
Share
Issue contents
Article statistics
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Download PDF of article
J. Appl. Cryst.
(2008).
41
,
1076-1088
https://doi.org/10.1107/S0021889808030823
Download PDF of article
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Article statistics
Issue contents
Share
Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior
G. Geandier
,
P.-O. Renault
,
S. Teat
,
E. Le Bourhis
,
B. Lamongie
and
P. Goudeau
A methodology using synchrotron X-rays and two-dimensional detectors to study the mechanical properties of thin films is presented.
Keywords:
synchrotron X-ray diffraction
;
polycrystalline thin films
;
two-dimensional detection
;
mechanical behavior
.
Read article
Similar articles
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS