Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2008).
41
,
366-372
https://doi.org/10.1107/S0021889807068094
Download PDF of article
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High-resolution X-ray diffraction
in situ
study of very small complexes: the case of hydrogenated dilute nitrides
G. Bisognin
,
D. De Salvador
,
E. Napolitani
,
M. Berti
,
A. Polimeni
,
M. Capizzi
,
S. Rubini
,
F. Martelli
and
A. Franciosi
This paper describes the use of
in situ
high-resolution X-ray diffraction measurements using a conventional laboratory source for the study of the evolution kinetics of very small complexes under annealing.
Keywords:
in situ
HRXRD
;
thermal annealing
;
small complexes
;
dissolution energy
;
semiconductors
.
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