A combined fit of total scattering and extended X-ray absorption fine structure data for local-structure determination in crystalline materials

Extended X-ray absorption fine structure (EXAFS) data were included in simultaneously fitted experimental data for the reverse Monte Carlo refinement of local atomic structure using the public domain software RMCProfile. Structural refinements of complex perovskites demonstrated that inclusion of the EXAFS data provided the constraints necessary to recover fine details of the local atomic arrangements.