Refinement of the λ/2 contribution to CCD detector data

A new method is proposed to improve structure modeling by taking into account the half-wavelength contribution (λ/2) to X-ray data measured on CCD and image-plate diffractometers.

New approaches to scaling data measured on a CCD diffractometer

Effective methods have been developed for empirical data scaling performed after the inclusion of known anisotropic effects that influence the measured intensities of diffraction reflections.