Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2009).
42
,
22-29
https://doi.org/10.1107/S0021889808039435
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Simulation of powder diffraction patterns of mixed-layer compounds in the restacked binary nanosheet system Ti
0.91
O
2
–MnO
2
M. Onoda
,
Z. Liu
,
K. Takada
and
T. Sasaki
The matrix method for diffuse scattering was effectively used to simulate powder X-ray diffraction patterns of misfit mixed-layer compounds in a restacked binary nanosheet system.
Keywords:
mixed-layer compounds
;
nanosheets
;
powder X-ray diffraction
.
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