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A model is proposed to calculate the diffraction efficiency of X-rays in Laue geometry for curved crystals with an arbitrary value of the curvature radius. The model generalizes the results based on the dynamical theory of diffraction, which are valid only for crystals with a radius of curvature lower than the critical curvature.

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A stack of Si curved crystals has been characterized under hard X-ray diffraction. The stack behaves as if it were a single crystal as a result of diffraction by curved diffracting planes.
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