Journal of Synchrotron Radiation
Journal of
Synchrotron Radiation
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
open access
journal menu
home
archive
editors
for authors
for readers
submit
open access
research papers
Share
Share
Issue contents
Article statistics
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Download PDF of article
J. Synchrotron Rad.
(2014).
21
,
1252-1261
https://doi.org/10.1107/S1600577514016555
Download PDF of article
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Article statistics
Issue contents
Share
Full-field X-ray reflection microscopy of epitaxial thin-films
N. Laanait
,
Z. Zhang
,
C. M. Schlepütz
,
J. Vila-Comamala
,
M. J. Highland
and
P. Fenter
The novel capabilities of a newly designed full-field X-ray reflection microscope to image a thin film with 70 nm resolution and sub-second exposures are demonstrated.
Keywords:
X-ray surface diffraction
;
X-ray microscopy
;
interfaces and thin films
;
materials science
.
Read article
Similar articles
Follow J. Synchrotron Rad.
E-alerts
Twitter
Facebook
RSS