Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering

An integration method is demonstrated for directly determining the average interface statistics or, more specifically, power spectral density of periodic multilayers from the X-ray scattering diagram.

Scanning transmission X-ray microscopy probe for in situ mechanism study of graphene-oxide-based resistive random access memory

An in situ probe for scanning transmission X-ray microscopy has been developed and applied to the study of the bipolar resistive switching mechanism in an Al/graphene oxide/Al resistive random access memory device.

Data analysis method to achieve sub-10 pm spatial resolution using extended X-ray absorption fine-structure spectroscopy

A new data analysis method allowing sub-10 pm spatial resolution to be obtained using EXAFS is presented. The method was tested using theoretical simulation and experimental data. A resolution better than 0.074 Å is achieved using 12 Å⁻¹ data which has a resolution limit of 0.13 Å for the existing EXAFS data analysis methods.