Journal of Synchrotron Radiation
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J. Synchrotron Rad.
(2014).
21
,
97-103
https://doi.org/10.1107/S1600577513024296
Download PDF of article
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Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering
H. Li
,
J. Zhu
,
Z. Wang
,
H. Chen
,
Y. Wang
and
J. Wang
An integration method is demonstrated for directly determining the average interface statistics or, more specifically, power spectral density of periodic multilayers from the X-ray scattering diagram.
Keywords:
X-ray scattering
;
multilayer
;
interface morphology
;
power spectral density
;
dynamic scaling
.
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