High-energy transmission Laue micro-beam X-ray diffraction: a probe for intra-granular lattice orientation and elastic strain in thicker samples

An extension of the micro-beam Laue diffraction technique to higher photon energies (50-150 keV) for improved penetration into thick samples is presented. The new technique is used to study the grain-level deformation behaviour of a polycrystalline nickel sample during in situ tensile deformation.