Application of glancing-emergent-angle fluorescence for polarized XAFS studies of single crystals

A. I. Frenkel, D. M. Pease, J. I. Budnick, P. Shanthakumar and T. Huang

The glancing-emergent-angle (GEA) method of fluorescence detection has been applied for polarized XAFS studies of single crystals of Cr-doped vanadium sesquioxides. The GEA method is non-destructive, suitable for in situ studies of single crystals and is thus a significant improvement over their powder analysis.

Keywords: X-ray absorption spectroscopy; fluorescence; single crystals; polarized measurements.

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