Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry

The time-dependent deformation tensor, having dilational and shear components, has been determined by time-resolved triple-crystal X-ray diffractometry. The observed dynamic deformation in a GaAs wafer irradiated by ultrashort laser pulses, i.e. pulsed photothermal deformation, was followed by the appearance of a flexural standing wave.