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J. Appl. Cryst. (2010). 43, 1415-1418
https://doi.org/10.1107/S0021889810041282
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The XIPHOS diffraction facility for extreme sample conditions

M. R. Probert, C. M. Robertson, J. A. Coome, J. A. K. Howard, B. C. Michell and A. E. Goeta
A new high-intensity laboratory diffractometer has been developed and optimized for single-crystal diffraction experiments under a range of sample environments.
Keywords: XIPHOS; extreme sample environments; diffractometers; m-nitroaniline.
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