Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2009).
42
,
990-993
https://doi.org/10.1107/S0021889809035717
Download PDF of article
Download citation
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Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer
B. H. Toby
,
Y. Huang
,
D. Dohan
,
D. Carroll
,
X. Jiao
,
L. Ribaud
,
J. A. Doebbler
,
M. R. Suchomel
,
J. Wang
,
C. Preissner
,
D. Kline
and
T. M. Mooney
A high-resolution and high-throughput synchrotron powder diffractometer has been automated for use with samples that are mailed in by Advanced Photon Source users.
Keywords:
Advanced Photon Source
;
automation
;
synchrotron powder diffraction
.
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