Measurement of stress factors and residual stress of a film by in situ X-ray diffraction during four-point bending

Stress factors and residual stress in a film are simultaneously measured by in-situ X-ray diffraction during four-point bending. The procedure, here applied to a galvanic nickel coating, can be used for virtually any polycrystalline layer, without previous knowledge of single-crystal elastic constants or grain interaction models.