Download citation
Download citation

link to html
It is shown that ExtSym can be used successfully with many well known powder diffraction analysis packages. In addition, a precise description of the optimal input for ExtSym is given to enable other software packages to interface with it.
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds