New measures of sharpness for symmetric powder diffraction peak profiles

New measures of sharpness for symmetric powder diffraction peak profiles are proposed. Analytical expressions for typical model profile functions and theoretical size-broadening profiles with statistical size distribution are presented.

Statistical properties of measured X-ray intensities affected by counting loss

The statistical properties of X-ray intensities measured with counting systems were experimentally investigated by repeated measurements based on Chipman's foil method. It is shown that the observed statistical variance can be well reproduced by a formula derived from an intermediately extended dead-time model for counting loss.