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A scanning-type X-ray spectrometer for Compton profile measurements has been built at the ESRF. The construction and performance are described in the present paper.

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Demonstration of a focusing multilayer analyser for local diffraction studies in bulk materials.

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The feasibility of heavy-element-sensitive tomography using synchrotron radiation on centimetre-scale samples containing uranium was proven. This was performed using a detector based on a CCD camera and a scintillation screen.
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