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J. Synchrotron Rad. (1999). 6, 69-80
https://doi.org/10.1107/S0909049599000291
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Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF

P. Suortti, T. Buslaps, P. Fajardo, V. Honkimäki, M. Kretzschmer, U. Lienert, J. E. McCarthy, M. Renier, A. Shukla, T. Tschentscher and T. Meinander
A scanning-type X-ray spectrometer for Compton profile measurements has been built at the ESRF. The construction and performance are described in the present paper.
Keywords: Compton scatterings; X-ray spectrometers.
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J. Synchrotron Rad. (1999). 6, 979-984
https://doi.org/10.1107/S0909049599001934
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A focusing multilayer analyser for local diffraction studies

U. Lienert, H. F. Poulsen, V. Honkimäki, C. Schulze and O. Hignette
Demonstration of a focusing multilayer analyser for local diffraction studies in bulk materials.
Keywords: X-ray optics; lattice strains.
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