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Gd monolayer films on Fe(100) are studied using circular X-ray magnetic dichroism and X-ray standing waves. The combination of the two techniques offers new perspectives for the in situ characterization of electronic and structural properties of thin magnetic films on crystalline substrates.

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A method for performing X-ray speckle-pattern correlation interferometry is explored. The summed small-angle scattering of two samples in series is simulated and tested for sensitivity to motion of one of the samples.
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