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J. Synchrotron Rad. (2014). 21, 623-626
https://doi.org/10.1107/S1600577514001283
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Sample thickness and quantitative concentration measurements in Br K-edge XANES spectroscopy of organic materials

A. C. Leri and B. Ravel
A method of quantifying absorber concentration from XANES spectra while correcting for effects of variable sample thickness is described.
Keywords: XANES; concentration measurement; thickness effect; thickness correction; bromine.
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J. Synchrotron Rad. (2014). 21, 1269-1274
https://doi.org/10.1107/S1600577514014982
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Path degeneracy and EXAFS analysis of disordered materials

B. Ravel
A method simplifying EXAFS analysis of highly disordered materials is presented.
Keywords: EXAFS; real-space multiple scattering; data analysis.
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