Study on the reflectivity properties of spherically bent analyser crystals

A treatment is presented to explain reflectivity curves of finite-size elastically bent analyser crystals for X-ray spectrometry.

Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

A new measurement technique for X-ray spectrometers equipped with a position-sensitive detector is introduced. It is based on the computational compensation of the effects of internal stress of curved analyser crystals to improve the energy resolution in the measurements of point-like samples with no loss of intensity.