Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar () GaN layers grown from the sidewall of an r-patterned sapphire substrate

Three-dimensional reciprocal space mapping is found to be a powerful and crucial method for the analysis of diffuse scattering originating from stacking faults that are diffracting in a noncoplanar geometry. The technique could be used to confirm transmission electron microscopy visibility criteria and to distinguish the origins of diffuse scattering signals.

Obtaining the structure factors for an epitaxial film using Cu X-ray radiation

An experimental methodology for obtaining a large set of structure factor moduli in thin films using laboratory X-ray equipment (Cu Kα radiation) has been developed. Using this methodology, the structure of a CuMnAs thin film has been solved and refined without prior knowledge of the film structure.