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J. Appl. Cryst. (2012). 45, 292-298
https://doi.org/10.1107/S0021889812000702
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Masquerade: removing non-sample scattering from integrated reflection intensities

J. A. Coome, A. E. Goeta, J. A. K. Howard and M. R. Probert
A new technique is introduced to remove non-sample scattering from integrated reflection intensities by utilizing changes in relative scattering vectors. This approach is found to improve data quality.
Keywords: X-ray diffraction; ultra-low temperature; non-sample scattering; Masquerade; computer programs.
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