Journal of Synchrotron Radiation
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J. Synchrotron Rad.
(1999).
6
,
781-783
https://doi.org/10.1107/S0909049598017075
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Tautomeric structure of
N
-salicylideneaniline derivatives studied by soft X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
E. Ito
,
H. Oji
,
T. Araki
,
K. Oichi
,
H. Ishii
,
Y. Ouchi
,
N. Kosugi
,
Y. Maruyama
,
T. Naito
,
T. Inabe
and
K. Seki
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surfaces
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J. Synchrotron Rad.
(1999).
6
,
796-798
https://doi.org/10.1107/S0909049598017348
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NEXAFS studies on the structure of perfluoroalkyl carbonic acid Langmuir Blodgett films
Y. Yamamoto
,
H. Ohara
,
I. Mori
,
K. Kajikawa
,
H. Ishii
,
Y. Kitajima
,
T. Imae
,
K. Seki
and
Y. Ouchi
Keywords:
NEXAFS
;
Langmuir Blodgett films
;
molecular orientation
;
rubbing process
.
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J. Synchrotron Rad.
(1999).
6
,
803-804
https://doi.org/10.1107/S0909049599004033
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Effective escape depth of photoelectrons for hydrocarbon films in total electron yield measurement as C K-edge
H. Ohara
,
Y. Yamamoto
,
K. Kajikawa
,
H. Ishii
,
K. Seki
and
Y. Ouchi
Keywords:
NEXAFS
;
effective escape depth
;
total electron yield
;
hydrocarbon films
.
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