High-resolution spectroscopy on an X-ray absorption beamline

J.-L. Hazemann, O. Proux, V. Nassif, H. Palancher, E. Lahera, C. Da Silva, A. Braillard, D. Testemale, M.-A. Diot, I. Alliot, W. Del Net, A. Manceau, F. Gélébart, M. Morand, Q. Dermigny and A. Shukla

A bent-crystal spectrometer has been developed and experiments have been carried out in order to demonstrate the interests of a high-resolution detection system on a classical X-ray absorption beamline.

Keywords: X-ray absorption spectroscopy; high-resolution X-ray analyzer; inelastic X-ray scattering; bent crystal.

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