Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

Y. Sekiguchi, T. Oroguchi, Y. Takayama and M. Nakasako

The software suite SITENNO is developed for processing diffraction data collected in coherent X-ray diffraction imaging experiments of non-crystalline particles using an X-ray free-electron laser.

Keywords: coherent X-ray diffraction imaging; X-ray free-electron laser; structure analysis of non-crystalline particles.

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