Journal of Synchrotron Radiation
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J. Synchrotron Rad.
(2012).
19
,
688-694
https://doi.org/10.1107/S0909049512023758
Download PDF of article
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In situ
three-dimensional reciprocal-space mapping during mechanical deformation
T. W. Cornelius
,
A. Davydok
,
V. L. R. Jacques
,
R. Grifone
,
T. Schülli
,
M.-I. Richard
,
G. Beutier
,
M. Verdier
,
T. H. Metzger
,
U. Pietsch
and
O. Thomas
The mechanical deformation of a SiGe island by a specially adapted atomic force microscope was monitored
in situ
by three-dimensional reciprocal-space mapping employing nanofocused X-ray diffraction.
Keywords:
X-ray diffraction
;
nanofocused XRD
;
energy scan
;
3D reciprocal-space mapping
;
mechanical deformation/properties
;
in situ
AFM
.
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