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A new type of high-resolution neutron monochromator based on multiple reflections realized in bent perfect crystals of Si and Ge was tested. By means of multiple reflections, a highly collimated and simultaneously highly monochromatic beam of rather large cross section can be obtained.

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A new analytical model for the surface effect in strain analysis by neutron diffraction has been developed. Spurious strains are calculated from primary parameters of the instrument to a precision allowing for reliable data corrections.
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