Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2008).
41
,
1053-1056
https://doi.org/10.1107/S0021889808029981
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DuMond analysis of bending in single crystals by Laue diffraction using σ–π polarization geometry
J. Serrano
,
C. Ferrero
,
M. Servidori
,
J. Härtwig
and
M. Krisch
A three-dimensional DuMond formalism is proposed for a σ–π polarization geometry and a combined Bragg–Laue diffraction, and is employed to quantify the bending of single-crystal analysers.
Keywords:
DuMond analysis
;
bent crystals
;
X-ray diffraction
.
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