Acta Crystallographica Section A
Acta Crystallographica
Section A
FOUNDATIONS AND ADVANCES
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
research papers
Share
Share
Issue contents
Article statistics
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Download PDF of article
Acta Cryst.
(2014).
A
70
,
572-582
https://doi.org/10.1107/S2053273314015113
Download PDF of article
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Article statistics
Issue contents
Share
An algorithm for calculating diffraction profiles of 2θ scans for multiple diffraction from crystals and thin films
H.-Y. Chen
,
M.-S. Chiu
,
C.-H. Chu
and
S.-L. Chang
An algorithm for calculating the 2θ diffraction profiles is developed based on the dynamical theory of X-ray diffraction for multi-beam cases. The connection between the 2θ-scanned profiles and the excitation of modes is revealed.
Keywords:
X-ray multiple diffraction
;
diffraction intensity profiles
;
dynamical theory
;
asymmetric diffraction
.
Read article
Similar articles
Follow Acta Cryst. A
E-alerts
Twitter
Facebook
RSS