Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2010).
43
,
504-510
https://doi.org/10.1107/S0021889810005856
Download PDF of article
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Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure
I. Halasz
,
R. E. Dinnebier
and
R. Angel
Parametric Rietveld refinement is extended to variable-pressure powder diffraction data. Different approaches to parameterization are described and compared.
Keywords:
parametric Rietveld refinement
;
powder diffraction
;
pressure
.
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