Application of a single-reflection collimating multilayer optic for X-ray diffraction experiments employing parallel-beam geometry

The performance of a diffractometer equipped with a rotating anode source, a single-reflection collimating multilayer optic which can collimate an X-ray beam in two mutually perpendicular planes and a parallel-plate collimator in front of the detector has been characterized in detail. Its capabilities have been illustrated by ray-tracing calculations for the multilayer optic and by standard powder diffraction experiments.

Non-ambient X-ray diffraction residual stress analysis of thin films: tracing nanosize-related effects on thermoelastic constants and identifying sources of residual stresses

Pitfalls during non-ambient X-ray diffraction stress analysis of thin films (with nanosized grains) are discussed. Recipes for identifying nanosize-related effects on thermoelastic constants and various sources of residual stresses are provided.

Determination of depth gradients of grain interaction and stress in Cu thin films

The depth gradients of grain interaction and stress in Cu thin films were determined by X-ray diffraction stress measurements at fixed penetration depths. The effects of the surface roughness and the refraction of the incident beam were illustrated on the basis of a comparison of synchrotron and laboratory measurements, utilizing the corresponding variation in wavelength for tuning the absorption.