Journal of Synchrotron Radiation
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diffraction anomalous fine structure
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J. Synchrotron Rad.
(1999).
6
,
335-337
https://doi.org/10.1107/S0909049598018226
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Reliability of structural parameters determined from DAFS data using the iterative dispersion integral algorithm
J. O. Cross
,
W. T. Elam
,
J. Woicik
and
L. B. Sorensen
Keywords:
DAFS
;
analysis
;
reliability
;
dispersion relations
.
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diffraction anomalous fine structure
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J. Synchrotron Rad.
(1999).
6
,
341-343
https://doi.org/10.1107/S0909049598016537
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Direct measurement of valence charge asymmetry in GaAs using X-ray standing waves
E. Nelson
,
J. Woicik
and
P. Pianetta
Keywords:
X-ray standing waves
;
semiconductor valence band
.
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condensed matter
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J. Synchrotron Rad.
(1999).
6
,
500-502
https://doi.org/10.1107/S0909049598015581
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Layer perfection in ultrathin MOVPE-grown InAs layers buried in GaAs(001) studied by X-ray standing waves and photoluminescence spectroscopy
J. A. Gupta
,
J. Woicik
,
S. P. Watkins
,
D. A. Harrison
,
E. D. Crozier
and
B. A. Karlin
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condensed matter
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J. Synchrotron Rad.
(1999).
6
,
570-572
https://doi.org/10.1107/S0909049598015556
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Bond lengths in semiconductor alloys
J. Woicik
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