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Anomalous small-angle X-ray scattering (ASAXS) is applied to structurally characterize the hindered growth process of CaF2 nanocrystals in an SiO2-based oxide glass resulting in a transparent glass ceramic.

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A line pattern is observed which overlays all images detected by an X-ray area detector with a single-crystalline sensor layer, as a result of diffraction within the sensor layer itself. The intensity of the detected signal is decreased by up to 20% on this pattern. Potential applications such as photon energy calibration and angular alignment are discussed.

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The nominal pitch of 25 nm of a self-assembled block copolymer line grating was determined as 24.83 (9) nm by the first traceable grazing-incidence small-angle X-ray scattering (GISAXS) measurements. Traceability is established by tracing all input parameters; the main contributions are the measurements of the sample-detector distance and of the pixel size.
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