research papers
Grazing-incidence small-angle scattering patterns of Ge nanodots self-organized on Si(001) with soft X-rays showed a strongly anisotropic scattering profile, although the patterns with hard X-rays are symmetric. This apparent difference is explained in terms of the curvature of the Ewald sphere and anisotropic structure factors.
beamlines
The BL28XU beamline, dedicated to rechargeable battery analysis, is described.