Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector

Corrections and image processing algorithms for data analysis with a prototype hybrid pixel detector are reported in the context of three different X-ray diffraction experiments with synchrotron radiation.

Strains in light-ion-implanted polycrystals: influence of grain orientation

Micro X-ray diffraction and mechanical modeling on low-energy (60 keV) light-ion (He)-implanted polycrystals have shown that the strain tensor has only three nonzero components, which depend on grain orientation.