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J. Appl. Cryst. (2010). 43, 1495-1501
https://doi.org/10.1107/S002188981004149X
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Characterization of the parameters relating adjacent grains using transmission electron microscopy

H. W. Jeong, S. M. Seo, H. U. Hong and Y. S. Yoo
A method is presented for determining the axis and angle of rotation between two neighbouring grains using a goniometer mounted on a transmission electron microscope.
Keywords: goniometers; transmission electron microscopy; grain boundaries; misorientation.
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