Strain-profile determination in ion-implanted single crystals using generalized simulated annealing

The strain profiles in ion-implanted single crystals are determined using high-resolution X-ray diffraction and the generalized simulated annealing algorithm.

Keywords: strain profiles; ion-implanted single crystals; simulated annealing.

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Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text