An investigation of goethite-seeded Al(OH)₃ precipitation using in situ X-ray diffraction and Rietveld-based quantitative phase analysis

In situ X-ray diffraction has been used to investigate goethite-seeded Al(OH)₃ precipitation from synthetic Bayer liquor at 343 K. Rietveld-based quantitative phase analysis has allowed for the determination of the absolute phase abundances of the precipitated phases and for the determination of kinetic information.

Whole-pattern profile fitting of powder diffraction data collected in parallel-beam flat-plate asymmetric reflection geometry

A simple, physically-based model which uses up to three refinable parameters to fit peak profiles is presented. The use of this model reduces the total number of parameters required to fit the observed peak profiles, hence leading to increased stability during profile analysis.