Download citation
Download citation

link to html
An X-ray tracing program was developed to simulate the instrument function of a laboratory high-resolution X-ray powder diffractometer. The results provide the basis for discussing the opportunity of using X-ray tracing in diagram-refinement software.
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds