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A method is presented and applied, capable of retrieving form-free particle size distributions complete with uncertainties from small-angle scattering patterns. Special attention is paid to particle observability in the scattering patterns, accurate estimation of data uncertainty and the effect of uncertainty on the resulting size distribution statistics.

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Window materials for small-angle X-ray scattering measurements have been evaluated using a vacuum camera. It is shown that window materials vary in how they scatter the background signal depending on the q range.
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