Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2010).
43
,
385-393
https://doi.org/10.1107/S0021889810005625
Download PDF of article
Download citation
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Structure of PbTe(SiO
2
)/SiO
2
multilayers deposited on Si(111)
G. Kellermann
,
E. Rodriguez
,
E. Jimenez
,
C. L. Cesar
,
L. C. Barbosa
and
A. F. Craievich
The structure of multilayered thin films - composed of layers of spherical PbTe nanocrystals embedded in an SiO
2
matrix - is studied by grazing-incidence small-angle X-ray scattering.
Keywords:
grazing-incidence small-angle X-ray scattering
;
GISAXS
;
nanocrystals
;
multilayers
;
semiconductors
.
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