Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2009).
42
,
469-479
https://doi.org/10.1107/S0021889809008802
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Ultra-small-angle X-ray scattering at the Advanced Photon Source
J. Ilavsky
,
P. R. Jemian
,
A. J. Allen
,
F. Zhang
,
L. E. Levine
and
G. G. Long
The design and operation of a versatile ultra-small-angle X-ray scattering instrument at the Advanced Photon Source at Argonne National Laboratory are presented.
Keywords:
ultra-small-angle X-ray scattering (USAXS)
;
Advanced Photon Source (APS)
.
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